Overview

• Covers IC design, noise modeling and characterization, electromagnetism, packaging and EMC measurements
• Includes standardized measurement methods, standardized modeling approaches, and dedicated tools

About this book

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.

Table of contents – (7 chapters)

• Front Matter
  Pages i-xiii
• Basic Concepts in EMC for ICs
  Pages 1-17
• Historical Review and State-of-the art
  Pages 19-54
• Fundamentals and Theory
  Pages 55-104

• Measurement Methods
  Pages 105-187
• EMC Modeling
  Pages 189-309
• Case Studies
  Pages 311-394
• Guidelines
  Pages 395-429
• Back Matter
  Pages 431-473

About the editors

Sonia Ben Dhia and Etienne Sicard are esteemed professors at the National Institute of Applied Sciences (INSA) in Toulouse, France, specializing in electrical and computer engineering.

Sonia Ben Dhia:

• Academic Background: Prof. Ben Dhia earned her Ph.D. in electronic design from INSA Toulouse in 1998.
• Professional Roles: She has been a professor at INSA Toulouse since 2000 and served as the Director of INSA Euro-Méditerranée in Fès, Morocco, from 2015 to 2017.
• Research Focus: Her research encompasses electromagnetic compatibility (EMC) in integrated circuits, with a particular emphasis on near-field scanning techniques and the impact of electromagnetic interference on electronic systems.
• Publications: Prof. Ben Dhia has co-authored works such as “Basics of CMOS Cell Design” alongside Prof. Sicard, contributing significantly to the field of CMOS design and EMC

Etienne Sicard:

• Academic Background: Prof. Sicard is a professor at INSA Toulouse, Department of Electrical and Computer Engineering, and conducts research on signal processing applied to speech therapy at LURCO research lab.
• Professional Roles: He is in charge of Industrial Relations at the GEI Department of INSA Toulouse.
• Research Focus: His research interests include integrated circuit design, electromagnetic compatibility, and signal processing.
• Publications: Prof. Sicard has authored several books, including “Basics of CMOS Cell Design” with Prof. Ben Dhia, and has contributed extensively to the field of integrated circuit design and EMC.

Both professors have significantly advanced the field of electronic design and electromagnetic compatibility through their research, publications, and contributions to academia.

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