Overview

• Strategies for design-oriented ESD protection
• Distributed ESD protection networks optimized for sub-90nm CMOS ICs
• ESD protection strategies for smart power ICs used in automotive industry
• The impact of burn-in testing (accelerated test methods) on the ESD robustness
• The charge board ESD (CBM) testing used for wireless products

About this book

ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor industry, the demand for graduates with a basic knowledge of ESD is also increasing. Today, there is a significant demand to educate the circuits design and reliability teams on ESD issues. This book makes an attempt to address the ESD design and implementation in a systematic manner. A design procedure involving device simulators as well as circuit simulator is employed to optimize device and circuit parameters for optimal ESD as well as circuit performance. This methodology, described in ESD Protection Device and Circuit Design for Advanced CMOS Technologies has resulted in several successful ESD circuit design with excellent silicon results and demonstrates its strengths.

About the Authors

Oleg Semenov, Hossein Sarbishaei, and Manoj Sachdev are co-authors of the book “ESD Protection Device and Circuit Design for Advanced CMOS Technologies,” This comprehensive work addresses the challenges associated with designing and implementing Electrostatic Discharge (ESD) protection circuits in advanced CMOS technologies. It is intended for practicing engineers working in circuit design, VLSI reliability, and testing domains. The book systematically covers ESD design and implementation, employing a design procedure that involves both device and circuit simulators to optimize parameters for optimal ESD and circuit performance.
Manoj Sachdev has (co)authored several books for Springer/Kluwer, indicating his active involvement in academic publishing within the field.

Table of contents

Front Matter
Pages i-xv

Introduction
Pages 1-19

ESD Models and Test Methods
Pages 21-43

ESD Devices for Input/Output Protection
Pages 45-83

Circuit Design Concepts for ESD Protection
Pages 85-116

ESD Power Clamps
Pages 117-146

ISBN:- 978-1-4020-8300-6

ESD Protection Circuits for High-Speed I/OS
Pages 147-172

ESD Protection for Smart Power Applications
Pages 173-197

ESD Protection for RF Circuits
Pages 199-218

Conclusion
Pages 219-222

Back Matter
Pages 223-227

RRP – £ 149.99

EMC/EMI Bookstore Price – £135.00

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