A book entitled Modern EMC Analysis Techniques

Modern EMC Analysis Techniques Volume II

Models and Applications

Authors: Nikolaos V. Kantartzis , 
Theodoros D. Tsiboukis

About this book

The objective of this two-volume book is the systematic and comprehensive description of the most competitive time-domain computational methods for the efficient modeling and accurate solution of modern real-world EMC problems.
Intended to be self-contained, it performs a detailed presentation of all well-known algorithms, elucidating on their merits or weaknesses, and accompanies the theoretical content with a variety of applications.
Outlining the present volume, numerical investigations delve into printed circuit boards, monolithic microwave integrated circuits, radio frequency microelectromechanical systems as well as to the critical issues of electromagnetic interference, immunity, shielding, and signal integrity. Biomedical problems and EMC test facility characterizations are also thoroughly covered by means of diverse time-domain models and accurate implementations.
Furthermore, the analysis covers the case of large-scale applications and electrostatic discharge problems, whilespecial attention is drawn to the impact of contemporary materials in the EMC world, such as double negative metamaterials, bi-isotropic media, and several others.

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About the Author

Nikolaos V. Kantartzis received the Diploma degree and Ph.D. degree in electrical and computer engineering from the Aristotle University of Thessaloniki (AUTH), Thessaloniki, Greece, in 1994 and 1999, respectively. In 1999, he joined the Applied and Computational Electromagnetic Laboratory, Department of Electrical and Computer Engineering, AUTH, as a Postdoctoral Research Fellow. He has authored or coauthored several refereed journal papers in the area of computational electromagnetics and especially higher order finite-difference time-domain (FDTD) method, perfectly matched layers (PMLs), nonorthogonal discretization algorithms, vector finite elements and alternating-direction implicit (ADI) formulations. His main research interests include time- and frequency-domain electromagnetic and acoustic analysis, EMC modeling, modern microwave circuits, antenna structures and metamaterials.

Dr. Tsiboukis earned his Diploma in Electrical and Mechanical Engineering from the National Technical University of Athens in 1971 and his Doctor of Engineering degree from Aristotle University of Thessaloniki (AUTH) in 1981. He began his academic career as a Senior Research Fellow at the University of Southampton (1981–1982) before joining AUTH’s Department of Electrical and Computer Engineering (DECE) in 1982. At AUTH, he held several leadership roles, including Director of the Division of Telecommunications (1993–1997) and Chairman of DECE (1997–2001). He also led the Advanced and Computational Electromagnetics Laboratory.Dr. Tsiboukis was a prolific author, contributing to over 270 refereed journal and conference papers, and coauthoring 8 books.
His research interests encompassed electromagnetic-field analysis using energy methods, computational electromagnetics (including FEM, MoM, FDTD methods), metamaterials, and electromagnetic compatibility (EMC) problems.
Dr. Theodoros D. Tsiboukis passed away in 2021, leaving behind a legacy of academic excellence and substantial contributions to the field of electrical engineering.

Table of contents

Front Matter
Pages i-x 
Introduction
Pages 1-5

Printed Circuit Boards in EMC Structures
Pages 7-43

Electromagnetic Interference, Immunity, Shielding, and Signal Integrity
Pages 45-89

Bioelectromagnetic Problems—Human Exposure to Electromagnetic Fields
Pages 91-136

Time-Domain Characterization of EMC Test Facilities
Pages 137-181

Large-Scale EMC and Electrostatic Discharge Problems
Pages 183-197

Contemporary Material Modeling in EMC Applications
Pages 237-238

Bibliographic Information

  • Authors
    Nikolaos V. Kantartzis , 
    Theodoros D. Tsiboukis
  • Publisher
    Springer
  • Published:
    Published: June 2008
  • Softcover
  • Number of Pages
    X, 238
  • ISBN:
     978-3-031-00578-7

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