ESD Design for Analog Circuits

Overview

• Includes case studies that involve four classes of baseline ESD devices
• Features based software simulation with topics that overlap the text material
• Provides many device level solutions

About this book

This Book and Simulation Software Bundle Project
Dear Reader, this book project brings to you a unique study tool for ESD protection solutions used in analog-integrated circuit (IC) design. Quick-start learning is combined with in-depth understanding for the whole spectrum of cross- disciplinary knowledge required to excel in the ESD field. The chapters cover technical material from elementary semiconductor structure and device levels up to complex analog circuit design examples and case studies. The book project provides two different options for learning the material. The printed material can be studied as any regular technical textbook. At the same time, another option adds parallel exercise using the trial version of a complementary commercial simulation tool with prepared simulation examples. Combination of the textbook material with numerical simulation experience presents a unique opportunity to gain a level of expertise that is hard to achieve otherwise. The book is bundled with simplified trial version of commercial mixed- TM mode simulation software from Angstrom Design Automation.
The DECIMM (Device Circuit Mixed-Mode) simulator tool is complementary to the book simulation examples and can be downloaded from www.analogesd.com. The simulation examples prepared by the authors support the specific examples discussed across the book chapters. A key idea behind this project is to provide an opportunity to not only study the book material but also gain a much deeper understanding of the subject by direct experience through practical simulation examples.

Table of contents
(8 chapters)

• Front Matter
  Pages i-xx
• Introduction
  Pages 1-14
• Conductivity Modulation in Semiconductor Structures Under Breakdown and Injection
  Pages 15-68
• Standard and ESD Devices in Integrated Process Technologies
  Pages 69-154
• ESD Clamps
  Pages 155-212

About the authors

Andrei Shibkov (Angstrom Design Automation, Inc., San Jose, USA) is a professional associated with Angstrom Design Automation, Inc., based in San Jose, USA. He is also noted for his co-authorship of the book ESD Design for Analog Circuits. This book provides an in-depth exploration of Electrostatic Discharge (ESD) protection strategies for analog circuit design, addressing challenges from basic semiconductor structures to advanced protection networks. It includes case studies on devices like DC-DC converters, level shifters, and high-speed amplifiers, making it a valuable resource for engineers in the field

ISBN:- 978-1-4419-6564-6

• ESD Network Design Principles
  Pages 213-279
• ESD Design for Signal Path Analog
  Pages 282-315
• Power Management Circuits’ ESD Protection
  Pages 317-393
• System-Level and Discrete Components ESD
  Pages 395-444
• Back Matter
  Pages 447-459

Dr. Vladislav Vashchenko (National Semiconductor, Santa Clara, USA earned his MS and Engineer-Physicist degree (1986) and Ph.D. in Physics of Semiconductors (1990) from Moscow Institute of Physics and Technology, where he studied self-organization in semiconductor structures under breakdown. He worked in the reliability department of State Research Institute “Pulsar” (Moscow) from 1984, advancing from intern to head of the laboratory. In 1997, he received his Doctor of Science in Microelectronics for his research on GaAs MESFETs, microwave silicon devices, and reliability test methods. From 1995-1997, he led projects for the Russian Space Agency and military/commercial clients. In 2000, he joined National Semiconductor Corp.’s Advanced Process Development Group, focusing on ESD protection design for analog products. He currently leads an R&D group for ESD development in new processes and products, with research interests in power devices, reliability, ESD solutions, and device simulation. He has authored 108 U.S. patents and over 80 research papers on reliability and ESD.

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